A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
0-9
Reset

Single Molecule Spectroscopy and Superresolution Imaging XVII

Publisher:      SPIE

From: _ To: _
Access online

Smart Structures and NDE for Energy Systems and Industry 4.0

Publisher:      SPIE

From: _ To: _
Access online

SIOEL '99: Sixth Symposium on Optoelectronics

Publisher:      SPIE

From: _ To: _
Access online

Smart Structures and NDE for Industry 4.0

Publisher:      SPIE

From: _ To: _
Access online

Situation Awareness in Degraded Environments 2019

Publisher:      SPIE

From: _ To: _
Access online

Smart Structures and NDE for Industry 4.0, Smart Cities, and Energy Systems

Publisher:      SPIE

From: _ To: _
Access online

Situation Awareness in Degraded Environments 2020

Publisher:      SPIE

From: _ To: _
Access online

Smart Structures, Devices, and Systems

Publisher:      SPIE

From: _ To: _
Access online

Sixteenth Conference on Education and Training in Optics and Photonics: ETOP 2021

Publisher:      SPIE

From: _ To: _
Access online

Smart Structures, Devices, and Systems II

Publisher:      SPIE

From: _ To: _
Access online

Sixteenth International Conference on Machine Vision (ICMV 2023)

Publisher:      SPIE

From: _ To: _
Access online

Smart Structures, Devices, and Systems III

Publisher:      SPIE

From: _ To: _
Access online

Sixteenth International Conference on Photonics and Imaging in Biology and Medicine (PIBM 2023)

Publisher:      SPIE

From: _ To: _
Access online

Smart Structures, Devices, and Systems IV

Publisher:      SPIE

From: _ To: _
Access online

Sixteenth International Conference on Photonics and Imaging in Biology and Medicine (PIBM 2023)

Publisher:      SPIE

From: _ To: _
Access online

Smart Structures: Optical Instrumentation and Sensing Systems

Publisher:      SPIE

From: _ To: _
Access online

Sixteenth International Conference on Quality Control by Artificial Vision

Publisher:      SPIE

From: _ To: _
Access online

Soft X-Ray and EUV Imaging Systems

Publisher:      SPIE

From: _ To: _
Access online

Sixteenth International Conference on Quality Control by Artificial Vision

Publisher:      SPIE

From: _ To: _
Access online

Soft X-Ray and EUV Imaging Systems II

Publisher:      SPIE

From: _ To: _
Access online
Image
P K Kelkar Library
Indian Institute of Technology Kanpur
Kanpur, U P 208016 India
E-mail: librarian@iitk.ac.in
Ph.: +91 512 259-7698 (Professor I/c, Library)
Ph.: +91 512 259-7233 (Circulation)
 
Downloads
+ Forms
Useful Links
+ IITs /IISc Libraries
+ Open Access Resources
Guidelines/Help
+ E-Resources Access
+ Thesis Submission
+ Library Rules
+ E-resources (Off-Campus)
+ SciFinder 

Opening Hours

Monday - Friday

08:00 am - 12:00 Midnight

Saturday

09:00 am - 12:00 Midnight

Sunday & Gazetted Holidays

09:00 am - 05:30 pm

Examination days:  Round the clock
Library Catalog