A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
0-9
Reset

Integrated Approaches to the Study of Historical Glass

Publisher:      SPIE

From: _ To: _
Access online

International Conference on Computer Network Security and Software Engineering (CNSSE 2022)

Publisher:      SPIE

From: _ To: _
Access online

Image and Video Compression

Publisher:      SPIE

From: _ To: _
Access online

Infrared Detectors and Focal Plane Arrays V

Publisher:      SPIE

From: _ To: _
Access online

Integrated Circuit Metrology I

Publisher:      SPIE

From: _ To: _
Access online

International Conference on Computer Network Security and Software Engineering (CNSSE 2023)

Publisher:      SPIE

From: _ To: _
Access online

Image and Video Processing

Publisher:      SPIE

From: _ To: _
Access online

Infrared Detectors and Focal Plane Arrays VI

Publisher:      SPIE

From: _ To: _
Access online

Integrated Circuit Metrology II

Publisher:      SPIE

From: _ To: _
Access online

International Conference on Computer Network Security and Software Engineering (CNSSE 2023)

Publisher:      SPIE

From: _ To: _
Access online

Image and Video Processing II

Publisher:      SPIE

From: _ To: _
Access online

Infrared Detectors and Focal Plane Arrays VII

Publisher:      SPIE

From: _ To: _
Access online

Integrated Circuit Metrology, Inspection, & Process Control

Publisher:      SPIE

From: _ To: _
Access online

International Conference on Computer Vision and Pattern Analysis (ICCPA 2021)

Publisher:      SPIE

From: _ To: _
Access online

Image and Video Processing III

Publisher:      SPIE

From: _ To: _
Access online

Infrared Detectors and Focal Plane Arrays VIII

Publisher:      SPIE

From: _ To: _
Access online

Integrated Circuit Metrology, Inspection, and Process Control II

Publisher:      SPIE

From: _ To: _
Access online

International Conference on Computer Vision, Application, and Algorithm (CVAA 2022)

Publisher:      SPIE

From: _ To: _
Access online

Image and Video Processing IV

Publisher:      SPIE

From: _ To: _
Access online

Infrared Detectors and Instrumentation

Publisher:      SPIE

From: _ To: _
Access online
Image
P K Kelkar Library
Indian Institute of Technology Kanpur
Kanpur, U P 208016 India
E-mail: librarian@iitk.ac.in
Ph.: +91 512 259-7698 (Professor I/c, Library)
Ph.: +91 512 259-7233 (Circulation)
 
Downloads
+ Forms
Useful Links
+ IITs /IISc Libraries
+ Open Access Resources
Guidelines/Help
+ E-Resources Access
+ Thesis Submission
+ Library Rules
+ E-resources (Off-Campus)
+ SciFinder 

Opening Hours

Monday - Friday

08:00 am - 12:00 Midnight

Saturday

09:00 am - 12:00 Midnight

Sunday & Gazetted Holidays

09:00 am - 05:30 pm

Examination days:  Round the clock
Library Catalog