E Journals (A to Z)

  2. Home
  3. Resources
  4. Journals
  5. E Journals (A to Z)
  6. Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on

Description

e-Journal Title Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on
Publisher IEL
Access Year From 1996 To 1996
Source eSS
Access online Access online
Image
P K Kelkar Library
Indian Institute of Technology Kanpur
Kanpur, U P 208016 India
E-mail: librarian@iitk.ac.in
Ph.: +91 512 259-7698 (Professor I/c, Library)
Ph.: +91 512 259-7233 (Circulation)
 
Downloads
+ Forms
Useful Links
+ IITs /IISc Libraries
+ Open Access Resources
Guidelines/Help
+ E-Resources Access
+ Thesis Submission
+ Library Rules
+ E-resources (Off-Campus)
+ SciFinder 

Opening Hours

Monday - Friday

08:00 am - 12:00 Midnight

Saturday

09:00 am - 12:00 Midnight

Sunday & Gazetted Holidays

09:00 am - 05:30 pm

Examination days:  Round the clock
Library Catalog