Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II

Catalog | Theses | IRINS | Pingala | New arrivals | Webmail | Book Search

E Journals (A to Z)

Description

e-Journal Title	Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II
Publisher	SPIE
Access Year	From _ To _
Source	SPIE Proceedings Volumes
Access online	Access online

P K Kelkar Library

Indian Institute of Technology Kanpur
Kanpur, U P 208016 India

E-mail: librarian@iitk.ac.in

Ph.: +91 512 259-7698 (Professor I/c, Library)

Ph.: +91 512 259-7233 (Circulation)

Downloads

Useful Links

+ IITs /IISc Libraries
+ Open Access Resources

Guidelines/Help

+ E-Resources Access
+ Thesis Submission
+ Library Rules
+ E-resources (Off-Campus)
+ SciFinder

Opening Hours

Monday - Friday

08:00 am - 12:00 Midnight

Saturday

09:00 am - 12:00 Midnight

Sunday & Gazetted Holidays

09:00 am - 05:30 pm

Examination days: Round the clock