E Journals (A to Z)

  2. Home
  3. Resources
  4. Journals
  5. E Journals (A to Z)
  6. In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing

Description

e-Journal Title In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing
Publisher SPIE
Access Year From _ To _
Source SPIE Proceedings Volumes
Access online Access online
Image
P K Kelkar Library
Indian Institute of Technology Kanpur
Kanpur, U P 208016 India
E-mail: librarian@iitk.ac.in
Ph.: +91 512 259-7698 (Professor I/c, Library)
Ph.: +91 512 259-7233 (Circulation)
 
Downloads
+ Forms
Useful Links
+ IITs /IISc Libraries
+ Open Access Resources
Guidelines/Help
+ E-Resources Access
+ Thesis Submission
+ Library Rules
+ E-resources (Off-Campus)
+ SciFinder 

Opening Hours

Monday - Friday

08:00 am - 12:00 Midnight

Saturday

09:00 am - 12:00 Midnight

Sunday & Gazetted Holidays

09:00 am - 05:30 pm

Examination days:  Round the clock
Library Catalog