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0-9

Industrial Applications of Holographic Nondestructive Testing

Publisher:      SPIE

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Industrial Applications of Laser Radar

Publisher:      SPIE

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Industrial Applications of Laser Technology

Publisher:      SPIE

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Industrial Applications of Optical Inspection, Metrology, and Sensing

Publisher:      SPIE

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Industrial Applications of Solid State Image Scanners

Publisher:      SPIE

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Industrial Inspection

Publisher:      SPIE

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Industrial Inspection II

Publisher:      SPIE

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Inorganic Optical Materials II

Publisher:      SPIE

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Inorganic Optical Materials III

Publisher:      SPIE

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Inorganic Optical Materials: A Critical Review

Publisher:      SPIE

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In-Plane Semiconductor Lasers III

Publisher:      SPIE

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In-Plane Semiconductor Lasers IV

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In-Plane Semiconductor Lasers V

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In-Plane Semiconductor Lasers: from Ultraviolet to Midinfrared

Publisher:      SPIE

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In-Plane Semiconductor Lasers: from Ultraviolet to Mid-Infrared II

Publisher:      SPIE

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In-Process Optical Measurements

Publisher:      SPIE

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In-Process Optical Measurements and Industrial Methods

Publisher:      SPIE

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In-Process Optical Metrology for Precision Machining

Publisher:      SPIE

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Input/Output and Imaging Technolgies II

Publisher:      SPIE

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Input/Output and Imaging Technologies

Publisher:      SPIE

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Insertion Devices for Synchrotron Sources

Publisher:      SPIE

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Instrument Design and Performance for Optical/Infrared Ground-based Telescopes

Publisher:      SPIE

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Instrumentation for Air Pollution and Global Atmospheric Monitoring

Publisher:      SPIE

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Instrumentation for Magnetospheric Imagery

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Instrumentation for Magnetospheric Imagery II

Publisher:      SPIE

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Instrumentation for Optical Remote Sensing from Space

Publisher:      SPIE

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Instrumentation for Planetary and Terrestrial Atmospheric Remote Sensing

Publisher:      SPIE

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Instrumentation for Submillimeter Spectroscopy

Publisher:      SPIE

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Instrumentation for UV/EUV Astronomy and Solar Missions

Publisher:      SPIE

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Instrumentation in Astronomy I

Publisher:      SPIE

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Instrumentation in Astronomy II

Publisher:      SPIE

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Interferometry XXI

Publisher:      SPIE

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Interferometry: Applications

Publisher:      SPIE

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Interferometry: Surface Characterization and Testing

Publisher:      SPIE

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Interferometry: Techniques and Analysis

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Internal Standardization and Calibration Architectures for Chemical Sensors

Publisher:      SPIE

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International Academic Conference on Optics and Photonics (IACOP 2023)

Publisher:      SPIE

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International Academic Conference on Optics and Photonics (IACOP 2023)

Publisher:      SPIE

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International Competitiveness and Business Techniques in Advanced Optics and Imaging

Publisher:      SPIE

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International Conference Micro- and Nano-Electronics 2012

Publisher:      SPIE

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International Conference Neutrons in Research and Industry

Publisher:      SPIE

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International Conference of Microelectronics: Microelectronics '92

Publisher:      SPIE

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International Conference on Advanced Algorithms and Neural Networks (AANN 2022)

Publisher:      SPIE

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International Conference on Advanced Manufacturing Technology and Manufacturing Systems (ICAMTMS 2022)

Publisher:      SPIE

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International Conference on Advanced Sensing and Smart Manufacturing (ASSM 2022)

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International Conference on Agri-Photonics and Smart Agricultural Sensing Technologies (ICASAST 2022)

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International Conference on Algorithm, Imaging Processing, and Machine Vision (AIPMV 2023)

Publisher:      SPIE

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International Conference on Algorithm, Imaging Processing, and Machine Vision (AIPMV 2023)

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International Conference on Algorithms, High Performance Computing, and Artificial Intelligence (AHPCAI 2021)

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International Conference on Algorithms, High Performance Computing, and Artificial Intelligence (AHPCAI 2023)

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