A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
0-9
Reset

Decision and Control, 1997., Proceedings of 36th IEEE Conference on

Publisher:      IEL

From: 1997 To: 1997
Access online

Decision and Control, 1998. Proceedings of 37th IEEE Conference on

Publisher:      IEL

From: 1998 To: 1998
Access online

Decision and Control, 1999. Proceedings of 38th IEEE Conference on

Publisher:      IEL

From: 1999 To: 1999
Access online

Decision and Control, 2000. Proceedings of 39th IEEE Conference on

Publisher:      IEL

From: 2000 To: 2000
Access online

Decision and Control, 2001. Proceedings of 40th IEEE Conference on

Publisher:      IEL

From: 2001 To: 2001
Access online

Decision and Control, 2002, Proceedings of 41st IEEE Conference on

Publisher:      IEL

From: 2002 To: 2002
Access online

Decision and Control, 2003. Proceedings. 42nd IEEE Conference on

Publisher:      IEL

From: 2003 To: 2003
Access online

Decision and Control, 2004. CDC. 43rd IEEE Conference on

Publisher:      IEL

From: 2004 To: 2004
Access online

Decision and Control, 2005 and 2005 European Control Conference. CDC-ECC '05. 44th IEEE Conference on

Publisher:      IEL

From: 2005 To: 2005
Access online

Decision Making and Problem Solving (Digest No: 1997/366), IEE Colloquium on

Publisher:      IEL

From: 1997 To: 1997
Access online

Decision Support Systems, IEE Colloquium on

Publisher:      IEL

From: 1991 To: 1991
Access online

Defect and Fault Tolerance in VLSI Systems, 1992. Proceedings., 1992 IEEE International Workshop on

Publisher:      IEL

From: 1992 To: 1992
Access online

Defect and Fault Tolerance in VLSI Systems, 1993., IEEE International Workshop on

Publisher:      IEL

From: 1993 To: 1993
Access online

Defect and Fault Tolerance in VLSI Systems, 1994. Proceedings., IEEE International Workshop on

Publisher:      IEL

From: 1994 To: 1994
Access online

Defect and Fault Tolerance in VLSI Systems, 1995. Proceedings., 1995 IEEE International Workshop on,

Publisher:      IEL

From: 1995 To: 1995
Access online

Defect and Fault Tolerance in VLSI Systems, 1996. Proceedings., 1996 IEEE International Symposium on

Publisher:      IEL

From: 1996 To: 1996
Access online

Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on

Publisher:      IEL

From: 1997 To: 1997
Access online

Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on

Publisher:      IEL

From: 1998 To: 1998
Access online

Defect and Fault Tolerance in VLSI Systems, 1999. DFT '99. International Symposium on

Publisher:      IEL

From: 1999 To: 1999
Access online

Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on

Publisher:      IEL

From: 2000 To: 2000
Access online
Image
P K Kelkar Library
Indian Institute of Technology Kanpur
Kanpur, U P 208016 India
E-mail: librarian@iitk.ac.in
Ph.: +91 512 259-7698 (Professor I/c, Library)
Ph.: +91 512 259-7233 (Circulation)
 
Downloads
+ Forms
Useful Links
+ IITs /IISc Libraries
+ Open Access Resources
Guidelines/Help
+ E-Resources Access
+ Thesis Submission
+ Library Rules
+ E-resources (Off-Campus)
+ SciFinder 

Opening Hours

Monday - Friday

08:00 am - 12:00 Midnight

Saturday

09:00 am - 12:00 Midnight

Sunday & Gazetted Holidays

09:00 am - 05:30 pm

Examination days:  Round the clock
Library Catalog