E Journals (A to Z)

  2. Home
  3. Resources
  4. Journals
  5. E Journals (A to Z)
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
0-9
Reset

ICONO 2007: Coherent and Nonlinear Optical Phenomena

Publisher:      SPIE

From: _ To: _
Access online

ICONO 2007: Nonlinear Laser Spectroscopy and High-Precision Measurements; and Fundamentals of Laser Chemistry and Biophotonics

Publisher:      SPIE

From: _ To: _
Access online

ICONO 2007: Nonlinear Space-Time Dynamics

Publisher:      SPIE

From: _ To: _
Access online

ICONO 2007: Novel Photonics Materials; Optics and Optical Diagnostics of Nanostructures

Publisher:      SPIE

From: _ To: _
Access online

ICONO 2007: Physics of Intense and Superintense Laser Fields; Attosecond Pulses; Quantum and Atomic Optics; and Engineering of Quantum Information

Publisher:      SPIE

From: _ To: _
Access online

ICONO 2010: International Conference on Coherent and Nonlinear Optics

Publisher:      SPIE

From: _ To: _
Access online

Imaging, Therapeutics, and Advanced Technology in Head and Neck Surgery and Otolaryngology 2022

Publisher:      SPIE

From: _ To: _
Access online

Imaging, Therapeutics, and Advanced Technology in Head and Neck Surgery and Otolaryngology 2023

Publisher:      SPIE

From: _ To: _
Access online

Imaging, Therapeutics, and Advanced Technology in Head and Neck Surgery and Otolaryngology 2023

Publisher:      SPIE

From: _ To: _
Access online

Imaging, Therapeutics, and Advanced Technology in Head and Neck Surgery and Otolaryngology 2024

Publisher:      SPIE

From: _ To: _
Access online

Imaging, Therapeutics, and Advanced Technology in Head and Neck Surgery and Otolaryngology 2024

Publisher:      SPIE

From: _ To: _
Access online

Impact of Lasers in Spectroscopy

Publisher:      SPIE

From: _ To: _
Access online

In Situ Industrial Applications of Optics

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Compressive Sampling, Large Data Analyses (LDA), Neural Networks, Biosystems, and Nanoengineering XIII

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering X

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering XI

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Compressive Sampling, Wavelets, Neural Net, Biosystems, and Nanoengineering XII

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Wavelets, and Neural Networks

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering IX

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering VII

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering VIII

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Wavelets, Unsupervised Nano-Biomimetic Sensors, and Neural Networks V

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Wavelets, Unsupervised Nano-Biomimetic Sensors, and Neural Networks VI

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Wavelets, Unsupervised Smart Sensors, and Neural Networks II

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Wavelets, Unsupervised Smart Sensors, and Neural Networks III

Publisher:      SPIE

From: _ To: _
Access online

Independent Component Analyses, Wavelets, Unsupervised Smart Sensors, and Neural Networks IV

Publisher:      SPIE

From: _ To: _
Access online

INDLAS 2007: Industrial Laser Applications

Publisher:      SPIE

From: _ To: _
Access online

Indo-Russian Workshop on Micromechanical Systems

Publisher:      SPIE

From: _ To: _
Access online

Industrial and Civil Applications of Infrared Technology

Publisher:      SPIE

From: _ To: _
Access online

Industrial and Commercial Applications of Holography

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Adaptive, and Synthetic Aperture Optical Systems

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Mid-IR, and Terahertz Technologies for Health and the Environment II

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Millimeter Wave, and Terahertz Technologies

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Millimeter-Wave, and Terahertz Technologies II

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Millimeter-Wave, and Terahertz Technologies III

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Millimeter-Wave, and Terahertz Technologies IV

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Millimeter-Wave, and Terahertz Technologies IX

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Millimeter-Wave, and Terahertz Technologies V

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Millimeter-Wave, and Terahertz Technologies VI

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Millimeter-Wave, and Terahertz Technologies VII

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Millimeter-Wave, and Terahertz Technologies VIII

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Millimeter-Wave, and Terahertz Technologies X

Publisher:      SPIE

From: _ To: _
Access online

Infrared, Millimeter-Wave, and Terahertz Technologies X

Publisher:      SPIE

From: _ To: _
Access online

Inhomogeneous and Quasi-Inhomogeneous Optical Coatings

Publisher:      SPIE

From: _ To: _
Access online

In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing

Publisher:      SPIE

From: _ To: _
Access online

In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II

Publisher:      SPIE

From: _ To: _
Access online

In-Line Characterization, Yield Reliability, and Failure Analyses in Microelectronic Manufacturing

Publisher:      SPIE

From: _ To: _
Access online

In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II

Publisher:      SPIE

From: _ To: _
Access online

In-Line Methods and Monitors for Process and Yield Improvement

Publisher:      SPIE

From: _ To: _
Access online

Innovative Optics and Phase Conjugate Optics

Publisher:      SPIE

From: _ To: _
Access online
Image
P K Kelkar Library
Indian Institute of Technology Kanpur
Kanpur, U P 208016 India
E-mail: librarian@iitk.ac.in
Ph.: +91 512 259-7698 (Professor I/c, Library)
Ph.: +91 512 259-7233 (Circulation)
 
Downloads
+ Forms
Useful Links
+ IITs /IISc Libraries
+ Open Access Resources
Guidelines/Help
+ E-Resources Access
+ Thesis Submission
+ Library Rules
+ E-resources (Off-Campus)
+ SciFinder 

Opening Hours

Monday - Friday

08:00 am - 12:00 Midnight

Saturday

09:00 am - 12:00 Midnight

Sunday & Gazetted Holidays

09:00 am - 05:30 pm

Examination days:  Round the clock
Library Catalog